about-me variable
Delmic invites you to their event

Delmic multibeam FAST-EM: technical aspects of the system

About this webinar

We are excited to announce the first technical overview of Delmic ultra-fast automated multibeam electron microscope: FAST-EM.

FAST-EM is a powerful solution for reliable and high throughput electron microscopy, which is designed to make complex and large EM projects simple and efficient. FAST-EM can be used to explore cell architecture, the interaction of neuronal circuits, and the analysis of any biological material in life-sciences. It is extremely beneficial for large volume 3D imaging, large scale 2D imaging and, in general, as a tool that can significantly speed up daily microscopy facility work. 

During this webinar our applications specialist Job Fermie will:

  • demonstrate the system's set up
  • show the sample loading and unloading
  • demonstrate how the multibeam is set up, generated and detected
  • give a preview of how the image is formed
  • show data acquired with the system

In the first two webinars we have already covered the possibilities of the system as well as discussed the benefits of fast electron microscopy for large-scale projects. You can watch the recordings of these webinar on our website.

If the time of the webinar doesn't fit you, don't worry, you will be able to access the recording later on.

Hosted by

  • Guest speaker
    Job Fermie

  • Team member
    Vera Lanskaya Marketing Manager @ Delmic


Powerful insights, simple workflows.

Delmic is a passionate high-tech company that develops powerful and user-friendly equipement for light and electron microscopy.
Through our great service, communication and expertise we help researchers and companies to focus on their research, and not on the instrument.