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Delmic invites you to their webinar

High throughput imaging with Delmic’s new Fast EM system

About this webinar

During the previous webinar, we talked about the challenges and improvements needed to achieve high-throughput imaging. Large-scale electron microscopy projects require powerful and high-throughput solutions, and are currently very complex due to inefficient workflows.

In this webinar, we will take a closer look at the development of a system that is up to these challenges. Our applications specialist Job Fermie will explain in detail Delmic’s upcoming multibeam electron microscope and look closer at the mechanisms used to rapidly capture data with 64 beams. With this webinar we want to give you a glimpse of what would be possible for your research with this system and what problems it will help to solve. Finally, Job will be showing application data acquired in the development prototype.

We are looking forward to an interesting discussion and questions from you at the end of the webinar.

In the third webinar, which will take place in August, we will go over the workflow in detail, by performing a demonstration on the newly developed system.

Hosted by

  • Guest speaker
    Job Fermie Applications specialist @ Delmic

  • Team member
    Vera Lanskaya Marketing Coordinator @ Delmic


Powerful insights, simple workflows.

Delmic is a passionate high-tech company that develops powerful and user-friendly equipement for light and electron microscopy.
Through our great service, communication and expertise we help researchers and companies to focus on their research, and not on the instrument.