MAPS 3: Automated Image and EDS Stitching for Phenom SEMs

Take your Scanning Electron Microscopy (SEM) workflows to the next level with MAPS 3, a sophisticated solution designed to automate image and elemental mapping for complex samples.

Traditional SEM analysis can often be time-consuming and labor-intensive, requiring manual alignment of images and frequent adjustments to imaging parameters. These challenges have become more pronounced when working with large fields of view or conducting multi-layer analyses.

MAPS 3 addresses these limitations with advanced automation tools that streamline workflows, reduce user workload, and enhance data consistency. With intuitive software integration into the Phenom SEM interface, it empowers users to create high-resolution composite images, align multiple data layers seamlessly, and maximize analytical efficiency.

In our upcoming webinar, Application Scientist Ron Allen will showcase the powerful features of MAPS 3 and provide practical tips that will help elevate your facility's SEM imaging capabilities. Discover how MAPS 3 is ideal for both novice microscopists and experienced researchers, delivering precision, versatility, and significant time savings.

What you'll learn: 

• How MAPS 3 integrates seamlessly with the Phenom SEM for enhanced imaging efficiency.
• Advanced features, including customizable stitching parameters and multi-layer data alignment.
• Techniques for automating image and EDS stitching to maximize data output with minimal effort.
• Practical steps for optimizing imaging workflows and analyzing complex samples.

We hope to see you there!