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Sepha invites you to their event

Multi-Q HD - Reliable CCIT down to 1 micron

About this event

In this on-demand webinar we will be introducing our latest innovation the Multi-Q HD, a new high performance leak tester for CCIT (Container Closure Integrity Testing) applications.

Utilising the vacuum decay test method, the new Multi-Q HD takes integrity testing to the next level, enabling ultra-sensitive, non-destructive detection of defects in pharmaceutical containers down to 1 micron. This enhanced testing functionality responds to demand from parenteral formats, which are experiencing unprecedented growth on the back of international Covid-19 vaccination programmes.

Join Philip Cooper (Head of Technology & New Product Development) and Shona McKenna (Mechanical Design Engineer) and learn how you can achieve 1┬Ám sensitivity using the Multi-Q HD.

Featured in this webinar:

  • Multi-Q HD technology explained
  • Applications of Multi-Q HD
  • ASTM F2338-09
  • Online Demonstration

Enjoy!


Interesting links:

Hosted by

  • Team member
    T
    Shona McKenna Mechanical Design Engineer @ Sepha Ltd.

  • Team member
    T
    Philip Cooper Head of Technology and New Product Development @ Sepha Limited

Sepha

Smart innovation

Innovative manufacturer of packaging and deblistering machines and non-destructive leak testing technology for the pharmaceutical industry