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Test Insight
www.testinsight.com
Upcoming events
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Past events
DA
YH
MG
Detecting Differences in Test Patterns
5 months ago
About 45 minutes
2022-06-28T09:00:00+0200
2022-06-28T18:00:00+0200
2022-06-28T09:00:00+0200
2022-06-28T18:00:00+0200
DA
Ce
MG
Adding DC measurements to Patterns
6 months ago
About 45 minutes
2022-05-31T09:00:00+0200
2022-05-31T18:00:00+0200
2022-05-31T09:00:00+0200
2022-05-31T18:00:00+0200
YH
Conditioning DFT patterns for Efficient conversion and Simplified ATE program
7 months ago
About 45 minutes
2022-04-26T09:00:00+0200
2022-04-26T18:00:00+0200
2022-04-26T09:00:00+0200
2022-04-26T18:00:00+0200
BG
MG
DM
Efficiently Managing Conversion of Design Vectors to Test Patterns - [9AM CET and 9AM PST]
8 months ago
About 45 minutes
2022-03-29T09:00:00+0200
2022-03-29T18:00:00+0200
2022-03-29T09:00:00+0200
2022-03-29T18:00:00+0200
MG
Ce
SCAN Pattern Validation and Debug - Pre or Post Silicon - [two times available to choose from]
9 months ago
About 45 minutes
2022-02-22T09:00:00+0100
2022-02-22T18:00:00+0100
2022-02-22T09:00:00+0100
2022-02-22T18:00:00+0100
