Test Insight events

Past events

DA YH MG	Detecting Differences in Test Patterns 3 months ago About 45 minutes or 1 other date	or 1 other date
DA Ce MG	Adding DC measurements to Patterns 4 months ago About 45 minutes or 1 other date	or 1 other date
YH	Conditioning DFT patterns for Efficient conversion and Simplified ATE program 5 months ago About 45 minutes or 1 other date	or 1 other date
BG MG DM	Efficiently Managing Conversion of Design Vectors to Test Patterns - [9AM CET and 9AM PST] 6 months ago About 45 minutes or 1 other date	or 1 other date
MG Ce	SCAN Pattern Validation and Debug - Pre or Post Silicon - [two times available to choose from] 8 months ago About 45 minutes or 1 other date	or 1 other date