Test Insight events

Upcoming events

or 1 other date

YH	Conditioning DFT patterns for Efficient conversion and Simplified ATE program 23 days ago About 45 minutes or 1 other date	or 1 other date
BG MG DM	Efficiently Managing Conversion of Design Vectors to Test Patterns - [9AM CET and 9AM PST] about 2 months ago About 45 minutes or 1 other date	or 1 other date
MG CE	SCAN Pattern Validation and Debug - Pre or Post Silicon - [two times available to choose from] 3 months ago About 45 minutes or 1 other date	or 1 other date
YH MG	-- Events to Patterns:- Clock Based Conversion -- [choice of 2 times] 4 months ago About 45 minutes or 1 other date	or 1 other date