about-me variable
Test Insight invites you to their event

Adding DC measurements to Patterns

About this event

A common test is to write a register in the DUT and thereafter do a DC measurement. Very often, the solution is to split up patterns and measure after each register write. A better way is to call DC measurements from inside the pattern.

Using the Advantest 93000 hardware, we can insert measurements at the correct positions and get all results in one pattern run. This simplifies the code and also reduces the test time overhead in starting and stopping patterns.

The solution presented is Advantest 93000-specific but the method is of interest for users of all platforms

Hosted by

  • Guest speaker
    Ce G
    Carl e Managing Director @ Elmen Consultants

    Carl Elmen is an independent test development consultant with over 15 years experience in the semiconductor industry as a hardware, software and test engineer. He has worked with many leading semiconductor companies and equipment vendors. Currently his main focus is using in-depth debug and optimisation techniques to develop fast, high-quality test programs for Advantest V93K.

  • Team member
    MG T
    Meir Gellis

  • Team member
    DA T
    Dima Angert

Test Insight

Linking Design and Test

Empowering Test, Product and DFT Engineers With Innovative Tools for Creating Ultimate Test Programs