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Conditioning DFT patterns for Efficient conversion and Simplified ATE program

About this event

A little well-judged editing of STIL files produced by ATPG tools such as TetraMax, FastScan or EncounterTest (and others) can lead to more efficient translations of these files into test patterns.

It can also result in test patterns that are less complex and easier to maintain. But achieving “well-judged” edits while using an ordinary text editor is challenging, to say the least. This tutorial shows you how easy it is to edit STIL programmatically to achieve results that would be impossible with an ordinary text editor.

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  • Team member
    YH T
    Yael Hadad

  • Team member
    T
    Three Tees from TestInsight

    Technical Tutorials helping engineers reduce time needed to develop and de-bug digital test patterns for all types of Automatic Test Equipment

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