About this event
Addressing the challenge of properly grouping large number of patterns for minimal timing complexity and re-use of common timing among those patterns.
Testing digital and mixed signal devices (during design debug, characterization and production test) can often require very large numbers of digital patterns. Managing the process of converting those patterns can become a wearisome and time-consuming task.
A proper conversion process takes into account sub groups of patterns targeted at specific device modes. This tutorial shows a simple way to manage the process more effectively.
Note: this tutorial doesn’t go into the nitty-gritty of doing the actual translations. The focus is on an easy method of reducing some of the tedium and in-efficiencies that are unnecessarily part of many flows.
Technical Tutorials helping engineers reduce time needed to develop and de-bug digital test patterns for all types of Automatic Test Equipment
Empowering Test, Product and DFT Engineers With Innovative Tools for Creating Ultimate Test Programs
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