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Efficiently Managing Conversion of Design Vectors to Test Patterns - [9AM CET and 9AM PST]

About this event

Addressing the challenge of properly grouping large number of patterns for minimal timing complexity and re-use of common timing among those patterns.

Testing digital and mixed signal devices (during design debug, characterization and production test) can often require very large numbers of digital patterns. Managing the process of converting those patterns can become a wearisome and time-consuming task.

A proper conversion process takes into account sub groups of patterns targeted at specific device modes. This tutorial shows a simple way to manage the process more effectively.

Note: this tutorial doesn’t go into the nitty-gritty of doing the actual translations. The focus is on an easy method of reducing some of the tedium and in-efficiencies that are unnecessarily part of many flows.


Hosted by

  • Team member
    MG T
    Meir Gellis

  • Team member
    T
    Three Tees from TestInsight

    Technical Tutorials helping engineers reduce time needed to develop and de-bug digital test patterns for all types of Automatic Test Equipment

  • Team member
    BG T
    Basmat Gabbay

  • Team member
    DM T
    David Mahgerefte Test Insight

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